The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2005
Filed:
Jan. 27, 2003
Applicant:
Udo Hartmann, Neuried, DE;
Inventor:
Udo Hartmann, Neuried, DE;
Assignee:
Infineon Technologies AG, Munich, DE;
Primary Examiner:
Int. Cl.
CPC ...
G01R031/26 ;
U.S. Cl.
CPC ...
Abstract
An apparatus for the parallel and independent testing of a plurality of semiconductor devices disposed on a wafer, in which the semiconductor devices are in each case connected to a common voltage supply unit through a controllable isolating apparatus, a voltage-regulating unit, and a current-limiting unit, and to a method for operating such an apparatus.
Hartmann, Udo. (2005). Apparatus and method for the parallel and independent testing of voltage-supplied semiconductor devices (U.S. Patent No. 6903565). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6903565
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile