The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2005

Filed:

Oct. 01, 2002
Applicants:

Michael L. Evans, Missouri City, TX (US);

Luca Ortenzi, Stavanger, NO;

Richard J. Radtke, Pearland, TX (US);

Inventors:

Michael L. Evans, Missouri City, TX (US);

Luca Ortenzi, Stavanger, NO;

Richard J. Radtke, Pearland, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01D018/00 ;
U.S. Cl.
CPC ...
Abstract

Techniques for calibrating well-logging sensors comprising emitting a first signal into a first calibration substance disposed proximate to the sensor, measuring a first sensor response from the first signal, emitting a second signal into a second calibration substance disposed proximate to the sensor, measuring a second sensor response from the second signal, and determining a sensor response function from the first sensor response and the second sensor response. One embodiment includes providing a well-logging sensor having a known response function, determining an expected range of a quality check response of the sensor using a quality-check substance with known properties, emitting a quality check signal into the quality-check substance, measuring the quality check response from the quality check signal, and comparing the expected range with the quality check response.


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