The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2005
Filed:
Jul. 31, 2001
Thane M. Larson, Roseville, CA (US);
Akbar Monfared, Placerville, CA (US);
Ian R. Inglis, Rocklin, CA (US);
Thane M. Larson, Roseville, CA (US);
Akbar Monfared, Placerville, CA (US);
Ian R. Inglis, Rocklin, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A method and apparatus controls fans and power supplies to provide accelerated run-in testing. By modulating fans to increase case temperatures and adjusting power supplies to provide 'worst case' voltages, a computer system can be subjected to a run-in tests under taxing conditions. By alternately cooling and heating devices such as CPUs, devices can be subjected to mechanical stresses associated with power-on/power off cycles. A time based test implements the present invention based on time, and a temperature based test implements the present invention based on temperature. The present invention can be used to implement a run-in test in which the computer system is operated at an elevated temperature, thereby achieving results similar to those achieved by performing a run-in test in an environmental chamber at an elevated temperature. Alternatively, the a run-in test can be performed by repeatedly cycling the temperature between relatively high and low values.