The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2005

Filed:

Dec. 27, 2001
Applicants:

Gregory Anthony Hrdlicka, Plymouth, MN (US);

Scott Grabinger, Maple Grove, MN (US);

Marc Stein, Chandler, AZ (US);

Dave Mueller, Roseville, MN (US);

Wilbert Wesselink, Viatron, NL;

Inventors:

Gregory Anthony Hrdlicka, Plymouth, MN (US);

Scott Grabinger, Maple Grove, MN (US);

Marc Stein, Chandler, AZ (US);

Dave Mueller, Roseville, MN (US);

Wilbert Wesselink, Viatron, NL;

Assignee:

Medtronic, Inc., Minneapolis, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61N001/375 ;
U.S. Cl.
CPC ...
Abstract

The present invention takes the form of a current limiting apparatus and method for limiting current flow, induced when the level of an external signal is greater than an external signal threshold signal level, in a conductive loop formed by a medical device implanted within a living organism having electrically excitable tissue. The system includes an implantable pulse generator (IPG) system having a housing, a signal generator disposed in the housing that generates an electrical signal, and at least one lead extending from the housing to convey electrical signal to the patient. To limit the induced current flow, the IPG includes current limiting componentry, an impedance increasing element, and/or alternating current blocking elements. These components provide an alternating current impedance path to the electrical ground from a lead coupled to the capacitive element. Also disclosed are techniques for reducing the effective surface area of the current inducing loop caused by the IPG system.


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