The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2005
Filed:
Feb. 18, 2000
Atsushi Maki, Fuchu, JP;
Tsuyoshi Yamamoto, Hatoyama, JP;
Hideaki Koizumi, Tokyo, JP;
Yuichi Yamashita, Kawagoe, JP;
Atsushi Maki, Fuchu, JP;
Tsuyoshi Yamamoto, Hatoyama, JP;
Hideaki Koizumi, Tokyo, JP;
Yuichi Yamashita, Kawagoe, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi Medical Corporation, Tokyo, JP;
Abstract
An optical measuring apparatus for optically measuring a sample includes a plurality of parts for applying light beams to the sample, a plurality of detecting parts for detecting light beams from the light applying parts which come through the sample, a memory part which receives signals from the detecting parts, converts them into digital signals and stores the digital signals as measuring positions between the light applying part and the light detecting part. Further, there is provided a first display part which shows a relationship between positions on the sample and measuring positions corresponding to the positions of the detecting parts on the sample, and a second display part which shows a relationship between positions on the sample and measuring positions corresponding to the positions of the detecting parts which are shown on the first display part.