The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2005
Filed:
Apr. 25, 2001
Timothy Alderson, Winter Spring, FL (US);
Gene D. Tener, Oviedo, FL (US);
Timothy Alderson, Winter Spring, FL (US);
Gene D. Tener, Oviedo, FL (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A method and apparatus for providing corrected values of gain and level coefficients of a set of correction coefficients for a scanning detector array, such as an IR detector array, comprising a plurality of detector channels is described. First values of the gain and level coefficients can be modified using at least one frame of image data collected by the scanning detector array from out-of-focus multiple-temperature imagery. Updated values of the gain and level coefficients can be determined using a scene-based non-uniformity correction (SBNUC) routine applied to scene data corresponding to focused scene imagery. The SBNUC routine can be applied iteratively such that updated values of gain and level coefficients converge to stable values.