The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2005

Filed:

Sep. 06, 2000
Applicant:

Shigeru Wakashiro, Tokyo, JP;

Inventor:

Shigeru Wakashiro, Tokyo, JP;

Assignee:

PENTAX Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K009/00 ; G06K009/62 ; G06K009/36 ; H04N015/00 ;
U.S. Cl.
CPC ...
Abstract

In an image processing computer system for a photogrammetric analytical measurement, a picture has an image of a target with three main reference point areas and an assistant reference point area. Positions of the reference point areas are determined by a two-dimensional picture coordinate system defined on the target. Positions of the main reference point areas are calculated with a three-dimensional camera coordinate system defined on a camera. Positions of the main reference point areas are calculated by a two-dimensional image-plane coordinate system, defined on an image-plane of the camera, based on the calculated three-dimensional positions of the main reference point areas. Camera parameters are calculated based on the two-dimensional positions of the main reference point areas of the picture coordinate system and the positions of the main reference point areas of the image-plane coordinate system.


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