The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2005

Filed:

Jun. 26, 2003
Applicants:

Jeffrey Eberhard, Albany, NY (US);

Abdulrahman Al-khalidy, Clifton Park, NY (US);

Inventors:

Jeffrey Eberhard, Albany, NY (US);

Abdulrahman Al-Khalidy, Clifton Park, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B006/03 ;
U.S. Cl.
CPC ...
Abstract

A tomosynthesis system for scanning a region in an object comprises a radiation source configured to traverse in a plurality of positions yielding a plurality of scanning directions. Each of the plurality of positions corresponds to a respective scanning direction. Further, the plurality of scanning directions comprise at least a scanning direction along a first axis and a direction along a second axis, the second axis being transverse to the first axis.


Find Patent Forward Citations

Eberhard, Jeffrey. (2005). System and method for scanning an object in tomosynthesis applications (U.S. Patent No. 6901132). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6901132

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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