The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2005

Filed:

Jan. 16, 2002
Applicants:

Jonathon Cheah, San Diego, CA (US);

Chee Kwang Quek, San Diego, CA (US);

EE Hong Kwek, San Diego, CA (US);

Inventors:

Jonathon Cheah, San Diego, CA (US);

Chee Kwang Quek, San Diego, CA (US);

Ee Hong Kwek, San Diego, CA (US);

Assignee:

Microtune (San Diego), Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F011/00 ;
U.S. Cl.
CPC ...
Abstract

An in-chip monitoring method and apparatus are disclosed. In one embodiment the apparatus includes a test pad, a transmission gate and a plurality of test components coupled to the transmission gate. The transmission gate is attached to a substrate and adapted to receive a code word uniquely addressed to one of the plurality of test components. In a further embodiment, the transmission gate is further adapted to relay an output of the one of the plurality of test components to the test pad, in response to receipt of the code word.


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