The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2005
Filed:
May. 21, 2002
Thorsten Bucksch, München, DE;
Ralf Schneider, München, DE;
Thorsten Bucksch, München, DE;
Ralf Schneider, München, DE;
Infineon Technologies AG, Munich, DE;
Abstract
A method for testing a memory circuit selects each cell in a region of a cell array as a target cell and performs a test cycle which includes selecting the target cell and neighboring cells which contain at least those cells for which is cannot be ruled out that their operation causes a fault-producing interaction. A data item is written to the target cell in order to produce one of two defined states. A write signal is applied to the neighboring cells in order to produce an undefined state which lies between the two defined states. The target cell and the neighboring cells are then read and the result of the reading process is used to check whether there is any interaction between the operation of the target cell and the operation of the neighboring cells.