The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2005
Filed:
Aug. 12, 2002
James A. Welker, Austin, TX (US);
Srinath Audityan, Austin, TX (US);
Jose M. Nunez, Austin, TX (US);
Robert C. Podnar, Austin, TX (US);
James A. Welker, Austin, TX (US);
Srinath Audityan, Austin, TX (US);
Jose M. Nunez, Austin, TX (US);
Robert C. Podnar, Austin, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
In response to a clock cycle and a pending READ command for data with a variably recurring access latency, a clock cycle count is adjusted. If a latency value has not been locked and if the READ command is a first READ command, the clock cycle count is stored as a locked latency value upon receiving a synchronized data available event (DQS for instance). Each subsequent READ command has an associated clock cycle count to enable pipelining wherein the clock cycle count for each READ starts incrementing when the individual READ command is issued. For subsequent READ commands, if the cycle count compares favorably with the locked latency value, data can be sampled safely from the interface at the identical latency for every READ request issued. The locked latency value can be read and/or written by software/hardware such that the read latency is consistent across multiple devices for reproducibility during debug.