The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2005

Filed:

Jun. 26, 2002
Applicants:

David A. Lehoty, Mountain View, CA (US);

Bryan Staker, Pleasanton, CA (US);

Inventors:

David A. LeHoty, Mountain View, CA (US);

Bryan Staker, Pleasanton, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J014/02 ; H04J014/08 ;
U.S. Cl.
CPC ...
Abstract

One embodiment disclosed relates to a method for calibrating an array of light-modulating elements. The method includes illuminating the array of elements, modulating an intensity of light diffracted by the elements over a modulation range, and measuring the modulated light intensity from each element of the array using a linear detector. Other embodiments disclosed relate to an apparatus and system for calibrating an array of light-modulating elements. The apparatus includes a light source for illuminating the array of elements and a linear detector for measuring light intensities at points along a line segment. The apparatus is configured so that modulated light from each of the elements impinges upon a different point of the line segment. The system includes means for modulating an intensity of light diffracted by the elements over a modulation range and a detector for measuring the modulated light intensity from each element of the array.


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