The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2005

Filed:

Aug. 28, 2002
Applicant:

Naoto Takeda, Tokyo, JP;

Inventor:

Naoto Takeda, Tokyo, JP;

Assignee:

TEAC Corporation, Musashino, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B007/00 ;
U.S. Cl.
CPC ...
Abstract

An optical disc apparatus for recording test data on a predetermined area of an optical disc under varied recording powers to determine an optimum recording power based on the quality of a signal obtained by reproducing the recorded test data. The test data is recorded under adverse recording conditions so as to evaluate the amount of change in quality of the reproduction signal. In order to create adverse recording conditions, the optical disc is tilted or the laser is defocused. A recording power for which the change in signal quality due to the deteriorated recording conditions is sufficiently small is determined as an optimum recording power capable of providing adequate recording margin.


Find Patent Forward Citations

Loading…