The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2005

Filed:

Nov. 16, 2004
Applicants:

Kenichi Kusaka, Hachioji, JP;

Kazuhiro Hayashi, Hachioji, JP;

Inventors:

Kenichi Kusaka, Hachioji, JP;

Kazuhiro Hayashi, Hachioji, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B021/06 ;
U.S. Cl.
CPC ...
Abstract

An illumination optical system for a microscope is provided wherein the illumination state can be successively changed between Koehler illumination and critical illumination while ensuring one or more conditions are satisfied so that the image of the light source illuminates an appropriately large region of the field of view of the microscope during critical illumination. Preferably, no cemented lens elements are used so that degradation of the cement caused by ultraviolet light sources is avoided, thereby enabling an appropriate illumination type to be provided at will and without degradation of the optical components of the illumination optical system over time.


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