The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2005
Filed:
Aug. 22, 2001
Roger L. Jungerman, Petaluma, CA (US);
Randall King, Santa Rosa, CA (US);
Gregory Steven Lee, Mountain View, CA (US);
Roger L. Jungerman, Petaluma, CA (US);
Randall King, Santa Rosa, CA (US);
Gregory Steven Lee, Mountain View, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A nonpolarization-dependent method and apparatus for optical sampling of a user optical signal of a known frequency range (e.g., corresponding to 1550 nm wavelength) uses a probe signal in an unsplit form and applies a conversion {e.g., by sum frequency generation (SFG)} operation in a first stage to the probe signal and to a first polarization component of the user optical signal (e.g., 's' component) to produce a first component of an output signal. In a second stage, a second polarization component of the user optical signal (e.g., 'p' component) is rotated by 90° to align with the first polarization component and then converted by mixing with the unsplit probe signal to produce a second component of an output signal. The first and second output component signals are both added and measured using a photomultiplier tube (PMT) or an avalanche diode.