The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2005

Filed:

Dec. 20, 2002
Applicants:

James E. Bishop, Santa Cruz, CA (US);

Sunil S. Dalal, Hayward, CA (US);

Zhenxiang Gong, Cupertino, CA (US);

Michael D. Lock, Mountain View, CA (US);

Inventors:

James E. Bishop, Santa Cruz, CA (US);

Sunil S. Dalal, Hayward, CA (US);

Zhenxiang Gong, Cupertino, CA (US);

Michael D. Lock, Mountain View, CA (US);

Assignee:

Becton, Dickinson and Company, Franklin Lakes, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N021/64 ; G01J003/30 ;
U.S. Cl.
CPC ...
Abstract

The present invention provides instruments for analyzing a multiplicity of fluorescent dyes using a multiplicity of amplifying photodetectors, methods for using the instruments, methods for setting the instrument parameters, and methods for resetting the instrument parameters following a changed in photodetector amplification. The present invention is particularly applicable in the field of flow cytometry.


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