The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2005
Filed:
Dec. 21, 2001
Mark A. Burns, McKinney, TX (US);
Mark A. Burns, McKinney, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A test apparatus () comprising a single handler () is coupled to a first tester () and second tester (), wherein the first () and second () testers are coupled together. A first test procedure is performed on a set of second IC's using the first tester (), simultaneously while a second test procedure is performed on a first set of IC's using the second tester (). Sets of IC's may be tested in parallel by a plurality of testers () within a single handler (). The first () and second () testers may be coupled to a multiplexer () to allow the use of a single test head (), which avoids having to make contact to the integrated circuit more than once, which is particularly advantageous in wafer probe testing.