The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2005

Filed:

Jan. 27, 1999
Applicant:

Fumio Hata, Mitaka, JP;

Inventor:

Fumio Hata, Mitaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T001/29 ;
U.S. Cl.
CPC ...
Abstract

An image pickup apparatus for X-ray photography is structurally adapted to absorb external impacts and possible resultant deformations such as deflections of the cabinet so that the interior is protected against damage and remains intact if the cabinet is deformed by the external load. The two-dimensional image pickup apparatus comprises a substrate, two-dimensional photoelectric converters formed on the substrate and an apparatus cabinet containing the substrate and the photoelectric converters. At least part of the apparatus cabinet is deformable and capable of restoring its original profile. A plurality of containers such as air bags may also be inserted into the gap between the substrate and the apparatus cabinet to prevent the inner wall surface of the apparatus cabinet and the substrate from contacting each other.


Find Patent Forward Citations

Loading…