The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2005

Filed:

Feb. 12, 2003
Applicants:

Ming-hsin Wu, Taoyuan Hsien, TW;

Ju-chung Chen, Taipei Hsien, TW;

Shu-shin Lin, Yunlin Hsien, TW;

Yen-lin Wang, Miaoli Hsien, TW;

Inventors:

Ming-Hsin Wu, Taoyuan Hsien, TW;

Ju-Chung Chen, Taipei Hsien, TW;

Shu-Shin Lin, Yunlin Hsien, TW;

Yen-Lin Wang, Miaoli Hsien, TW;

Assignee:

RiTdisplay Corporation, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L031/00 ;
U.S. Cl.
CPC ...
Abstract

A method for measuring optoelectronic characterstics of an organic light emitting diode. A computer, a power supply and a cavity are provided. The cavity has a tooling, on which at least one photodiode is mounted. A high temperature, high humidity, or high temperature and humidity condition is applied to the cavity. The computer is used to control the power supply for supplying a current or a voltage to the organic light emitting diode to generate a light with a brightness. A signal carrying brightness information of the light is then transmitted to the computer (two signals with different brightness have to be input to the computer first) for performing data process.


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