The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2005

Filed:

Jan. 07, 2002
Applicants:

David R. Cox, Belmont, CA (US);

Bradley A. Margus, Boca Raton, FL (US);

Nila Patil, Woodside, CA (US);

Inventors:

David R. Cox, Belmont, CA (US);

Bradley A. Margus, Boca Raton, FL (US);

Nila Patil, Woodside, CA (US);

Assignee:

Perlegen Sciences, Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12Q001/68 ; C07H021/02 ; C07H021/04 ;
U.S. Cl.
CPC ...
Abstract

Improved systems and methods for performing genetic analyses. Full genomic DNA scans are performed on the genetic DNA from a plurality of individuals to identify genetic variants. For those variants, but not based on a full genetic DNA scan, the variants alone are scanned in additional individuals to identify blocks of the variants that tend to be inherited together.


Find Patent Forward Citations

Cox, David. (2005). Genetic analysis systems and methods (U.S. Patent No. 6897025). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6897025

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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