The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2005
Filed:
Nov. 19, 2002
Methods and apparatus for isolating critical paths on an ic device having a thermal energy generator
Siuki Chan, Cupertino, CA (US);
Steven H. C. Hsieh, Cupertino, CA (US);
Siuki Chan, Cupertino, CA (US);
Steven H. C. Hsieh, Cupertino, CA (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
Test methods and circuits isolate thermal effects from AC effects on circuit performance. Critical paths for a failing programmable logic device (PLD) are identified and tested. This testing minimizes the impact of power-supply flicker and noise by eliminating or inactivating circuitry not required to test the critical paths. DC thermal energy generators are instantiated on the PLD adjacent the critical paths to heat the critical paths to one or more test temperatures. The critical paths are then tested over an appropriate range of temperatures and supply-voltages.