The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2005

Filed:

Aug. 28, 2003
Applicants:

Song-feng MO, Webster, NY (US);

Wendy K. Apton, Rochester, NY (US);

Stephen F. Randall, Eden, NY (US);

Patrick J. Walker, Henrietta, NY (US);

Inventors:

Song-feng Mo, Webster, NY (US);

Wendy K. Apton, Rochester, NY (US);

Stephen F. Randall, Eden, NY (US);

Patrick J. Walker, Henrietta, NY (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G015/08 ;
U.S. Cl.
CPC ...
Abstract

In a hybrid jumping (HJD) or hybrid scavengeless (HSD) development station used in xerography, a control system avoids arcing conditions in a gap between a donor member and an image receptor. In a set-up operation, a series of test patches are produced while incrementing the AC amplitude in the gap. A change in reflectivity of the patches as a function of the AC amplitude in the gap is measured and the actual width of the gap is thus estimated. An accurate estimate of the gap width can then be used in a control algorithm.


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