The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2005
Filed:
Jan. 04, 2002
Pai-chi LI, Taipei, TW;
Jing-jung Huang, Tainan Hsien, TW;
Shue-e Chen, Tainan Hsien, TW;
You-ling Gau, Yunghe, TW;
Tzu-yin Chu, Junghe, TW;
Pai-Chi Li, Taipei, TW;
Jing-Jung Huang, Tainan Hsien, TW;
Shue-E Chen, Tainan Hsien, TW;
You-Ling Gau, Yunghe, TW;
Tzu-Yin Chu, Junghe, TW;
Chung-Shan Institute of Science and Technology, Taoyuan, TW;
Abstract
Disclosed is focus control method for Delta-Sigma based image formation devices in which a steering term and a focusing term of a delay formula are respectively quantized, and corresponding two channels at both sides of the probe are synchronized by a delay produced during dynamic focusing. During synchronizing the two channels, two numeral values with equal absolute value but with opposite signs are respectively inserted so as to eliminate extra noise the signals are after summing up, and controlling common delay of the two channels is performed by same one controller. After summing up the inserted two values, the dynamic aperture control of the Delta-Sigma based image formation device can be effectively realized and noise during dynamic focusing also is eliminated thereby achieving an ideal single bit output.