The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2005
Filed:
Jun. 12, 2001
Rika Baba, Kodaira, JP;
Ken Ueda, Ome, JP;
Hitachi Medical Corporation, Tokyo, JP;
Abstract
The present invention provides an x-ray measuring apparatus for diagnosis having high spatial resolution and high sensitivity, which includes: an x-ray source for emitting x-rays from an x-ray focal spot; an x-ray detector in which a plurality of sensing elements each having a sensitive part and a blind part surrounding the sensitive part are arranged two-dimensionally; data processing means for collecting output signals of the sensing elements and performing data processing; and an anti-scatter grid disposed between the x-ray focal spot and the x-ray detector with predetermined distance from the position of the x-ray focal spot and in which an x-ray transmitting member and an x-ray shielding member are alternately arranged in a first direction. A pitch in the first direction of linear images projected on a sensing surface of the x-ray detector of the x-ray shielding member by the x-ray is set to be substantially an integral multiple of two or larger of the pitch of arrangement of the sensing elements in the first direction. In such a manner, a moiré-free image of a wide field of view is obtained.