The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2005
Filed:
Nov. 22, 2002
Ang Shih, San Jose, CA (US);
S. Jeffrey Rosner, Palo Alto, CA (US);
Ang Shih, San Jose, CA (US);
S. Jeffrey Rosner, Palo Alto, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
An apparatus and method for inspecting parts. The apparatus includes an x-ray source for illuminating a part from a plurality of locations with respect to the part and an imaging detector for forming a plurality of measured x-ray images of the part, one such measured x-ray image corresponding to each of the illumination locations. A controller compares each of the measured x-ray images with a corresponding calibration image. The controller provides a defective part indication if one of the measured x-ray images differs from the corresponding calibration image by more than a threshold value in part of the measured x-ray image. The controller localizes defects on the part by comparing two or more of the measured x-ray images with two or more corresponding calibration images. The calibration images can be constructed from measured images of defect free parts.