The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2005
Filed:
Apr. 27, 2000
Applicant:
Steven D. Cech, Aurora, OH (US);
Inventor:
Steven D. Cech, Aurora, OH (US);
Assignee:
Pressco Technology Inc., Cleveland, OH (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N021/00 ;
U.S. Cl.
CPC ...
Abstract
An inspection system is provided comprising at least one detection element () sensitive to electromagnetic radiation () at a wavelength wherein the object () to be inspected is rendered opaque by naturally occurring material molecular absorptions. As such, material defects such as cracks and voids can be detected.
Cech, Steven. (2005). System and method for inspecting the structural integrity of visibly clear objects (U.S. Patent No. 6894775). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6894775
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile