The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2005

Filed:

May. 25, 2000
Applicants:

Kaori Inoue, Kyoto, JP;

Masayuki Adachi, Kyoto, JP;

Inventors:

Kaori Inoue, Kyoto, JP;

Masayuki Adachi, Kyoto, JP;

Assignee:

Horiba, Ltd., Miyanohigashi-machi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21G004/00 ; G01J005/02 ;
U.S. Cl.
CPC ...
Abstract

The present invention provides a multi-component gas analyzing method using FTIR, which can correct for an influence of a coexistent gas due to an intensity change in the spectrum itself that occurs depending on the base gas composition so that it is possible to carry out, a measurement with high precision. A plurality of components in a sample are quantitatively analyzed based upon an absorption spectrum obtained by FTIR. After having calculated multi-component concentrations from a mixed gas spectrum by using a quantitative algorithm, calculations are further carried out so as to correct for a change in spectrum due to a coexistent gas component with respect to part of target components.


Find Patent Forward Citations

Loading…