The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2005

Filed:

Jun. 11, 2001
Applicants:

Christine Kranz, Atlanta, GA (US);

Boris Mizaikoff, Atlanta, GA (US);

Alois Lugstein, Vienna, AT;

Emmerich Bertagnolli, Vienna, AT;

Inventors:

Christine Kranz, Atlanta, GA (US);

Boris Mizaikoff, Atlanta, GA (US);

Alois Lugstein, Vienna, AT;

Emmerich Bertagnolli, Vienna, AT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N023/00 ;
U.S. Cl.
CPC ...
Abstract

A device for simultaneously carrying out an electro-chemical and a topographical near field microscopy is described, which device comprises a region for topographical near field measurement and a region for electrochemical near field measurement, with the region for topographical near field measurement extending completely as far as to the immediate tip of the arrangement, characterized in that the region for electrochemical near field measurement starts at a defined distance from the immediate tip.


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