The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2005
Filed:
Aug. 06, 2002
Mark Slutz, Colorado Springs, CO (US);
William Schmitz, Monument, CO (US);
David SO, Colorado Springs, CO (US);
Mark Slutz, Colorado Springs, CO (US);
William Schmitz, Monument, CO (US);
David So, Colorado Springs, CO (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
Disclosed is a method for automatically testing the deskew setting for the clock in a parallel data interface. The deskew value is varied to a high and a low limit to the point where errors occur when transmissions occur. After determining the high and low operable limits of the deskew values, an optimum deskew setting may be determined and set for the system. The present invention may be used as a design verification technique, for optimizing a system after integration, or for further optimization of the deskew value after performing a training pattern for optimizing transmission performance.