The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2005
Filed:
Jun. 07, 2002
Martin Keller, Vaihingen, DE;
Dieter Roller, Schoenaich, DE;
Martin Keller, Vaihingen, DE;
Dieter Roller, Schoenaich, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A technique for determination of an exception in multi-dimensional data is provided. The method determines an expected value for a set of cells of the multi-dimensional data by means of an ANOVA based method. A residual for each cell of the set of cells is then determined. Scaling of the residuals is then carried out, and the scaled residuals are then compared with a threshold value for determination of the exception.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile