The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2005
Filed:
Dec. 27, 2002
Applicants:
Jun Gi Choi, Seoul, KR;
Kang Seol Lee, Seoul, KR;
Inventors:
Jun Gi Choi, Seoul, KR;
Kang Seol Lee, Seoul, KR;
Assignee:
Hynix Semiconductor Inc., Gyunggi-do, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C007/00 ;
U.S. Cl.
CPC ...
Abstract
A semiconductor memory test device configured to reduce level variations of a core voltage and a pumping voltage by shorting an external power voltage and the pumping voltage according to input of a test signal in an operation life test or a burn-in test, and to control levels of the core voltage and a peri voltage according to a level of the external power voltage is disclosed herein. As a result, the semiconductor memory test device is configured to obtain a sufficient margin of the external power voltage and to adaptively transmit a stress voltage to 2.5 V/3.3 V DRAM.