The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2005
Filed:
Feb. 06, 2002
Applicants:
Hilmar Gugel, Dossenheim, DE;
Joerg Bewersdorf, Heidelberg, DE;
Stefan W. Hell, Goettingen, DE;
Inventors:
Assignee:
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B021/06 ; G02B021/00 ;
U.S. Cl.
CPC ...
Abstract
The present invention concerns a double confocal scanning microscope having an illuminating beam path () of a light source () and a detection beam path () of a detector (), and in order to eliminate at their cause the problems of reconstruction methods. To do so, at least one optical component () acting on the illuminating and/or detection beam path () is provided, and is configured in such a way that it influences the amplitude and/or phase and/or polarization of the light; and the characteristics of the double confocal illumination and/or detection are thereby modifiable.