The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2005

Filed:

Aug. 28, 2000
Applicant:

Yoichi Nakamura, Kanagawa, JP;

Inventor:

Yoichi Nakamura, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N001/04 ;
U.S. Cl.
CPC ...
Abstract

An image reading apparatus in which extended image reading time is prevented when high quality image data is obtained, which image data is corrected by invisible light such as infrared light which is transmitted through an original. In a CCD scanner, visible light emitted from a light source is irradiated onto a photographic film. Infrared light emitted from the light source is reduced by an IR light reducing filter to be irradiated onto the photographic film. Visible light which has been transmitted through the photographic film is irradiated on a linear CCD by a lens unit, and the infrared light is reflected by a dichroic mirror to be irradiated on the linear CCD. Accordingly, the reading of invisible light can be effected at the same time that the reading of visible light is effected. It is therefore possible to prevent image reading time from becoming long due to the time required for the receiving of invisible light.


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Nakamura, Yoichi. (2005). Image reading apparatus and image reading method (U.S. Patent No. 6891645). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6891645

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