The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2005

Filed:

Oct. 11, 2001
Applicants:

J. Kevyn Smith, Houston, TX (US);

C. Mitch Means, Richmond, TX (US);

Mingdong Yuan, Missouri City, TX (US);

John L. Przybylinski, Missouri City, TX (US);

Thomas H. Lopez, Houston, TX (US);

Michael James Ponstingl, St. Louis, MO (US);

Inventors:

J. Kevyn Smith, Houston, TX (US);

C. Mitch Means, Richmond, TX (US);

Mingdong Yuan, Missouri City, TX (US);

John L. Przybylinski, Missouri City, TX (US);

Thomas H. Lopez, Houston, TX (US);

Michael James Ponstingl, St. Louis, MO (US);

Assignee:

Baker Hughes Incorporated, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N033/28 ;
U.S. Cl.
CPC ...
Abstract

The present invention provides a method and system for controlling mineral scale deposition from a formation fluid. The rate at which scaling is occurring is measured in real time using an attenuated total reflectance probe and a photometer. The results are then used to determine whether to increase, decrease or leave unchanged addition of anti-scaling additives.


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