The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2005
Filed:
Dec. 31, 2002
Applicant:
Gregory Scott Winn, Fort Collins, CO (US);
Inventor:
Gregory Scott Winn, Fort Collins, CO (US);
Assignee:
LSI Logic Corporation, Milpitas, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R023/02 ;
U.S. Cl.
CPC ...
Abstract
The present invention is a method, system, and product for testing operating characteristics of a continuous-time or discrete-time device under test, which is included within a circuit. The operating characteristics of the continuous-time or discrete-time device are tested utilizing electronic components that already exist within the circuit such that a test circuit is not utilized to test the device. The circuit includes a variable gain amplifier and an automatic gain correction (AGC) circuit. The operating characteristics of the device are tested utilizing the variable gain amplifier and said AGC circuit.