The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2005

Filed:

Mar. 25, 2004
Applicants:

Kenji Kaneko, Tokyo, JP;

Shinichi Suzuki, Saitama, JP;

Homu Takayama, Saitama, JP;

Tadahisa Hoshino, Tokyo, JP;

Takanori Yachi, Tokyo, JP;

Masayuki Ueno, Saitama, JP;

Inventors:

Kenji Kaneko, Tokyo, JP;

Shinichi Suzuki, Saitama, JP;

Homu Takayama, Saitama, JP;

Tadahisa Hoshino, Tokyo, JP;

Takanori Yachi, Tokyo, JP;

Masayuki Ueno, Saitama, JP;

Assignee:

PENTAX Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B027/40 ;
U.S. Cl.
CPC ...
Abstract

A surveying instrument includes a sighting telescope optical system, a distance measuring system which outputs first data, a phase detection autofocus system which and outputs second data, and an AF driver which moves a focusing lens of the sighting telescope optical system to bring the sighting object into focus in accordance with one of the first data and the second data. A surveying instrument is also disclosed, which includes a sighting telescope and an AF drive unit which is provided separately from the sighting telescope, wherein the AF drive unit can be mounted to and dismounted from a body of the surveying instrument.


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