The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2005
Filed:
Nov. 22, 2002
S. Jeffrey Rosner, Palo Alto, CA (US);
Russell Iimura, Sunnyvale, CA (US);
S. Jeffrey Rosner, Palo Alto, CA (US);
Russell Iimura, Sunnyvale, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
An imaging system and method for using the same is disclosed. The imaging system includes an x-ray detection array or plurality of detection arrays, a point x-ray source, and a controller. The point x-ray source moves relative to a detection array, each of the x-ray detectors subtending a solid angle at the point source that depends on the relative position of the point source and the detection array and on the location of the detector in the detection array. The signal generated by each x-ray detector depends on a calibration parameter that is independent of the solid angle subtended by that x-ray detector at the point source. The controller stores a table of calibration values that determines the calibration parameter for each of the x-ray detectors. The controller corrects the signals generated by the x-ray detectors for solid angle and for variations in the calibration parameter.