The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2005

Filed:

Jul. 16, 2003
Applicants:

James C. Robinson, Knoxville, TN (US);

Nicolas Fulciniti, Lancaster, NY (US);

Mitchell J. Illig, West Seneca, NY (US);

William J. Ashton, Cincinatti, OH (US);

Inventors:

James C. Robinson, Knoxville, TN (US);

Nicolas Fulciniti, Lancaster, NY (US);

Mitchell J. Illig, West Seneca, NY (US);

William J. Ashton, Cincinatti, OH (US);

Assignee:

PCB Piezotronics Inc., Depew, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N029/00 ;
U.S. Cl.
CPC ...
Abstract

A method and apparatus for sensing and measuring stress waves. The method comprises the steps of: a.) sensing motion, where the motion comprises a stress wave component and a vibration component; b.) separating the stress wave component from the vibration component with a high pass filter to create a signal proportional to the stress wave; c.) amplifying the signal to create an amplified signal; d.) processing the amplified signal with a sample and hold peak detector over a predetermined interval of time to determine peaks of the amplified signal over said predetermined period of time; e.) creating an output signal proportional to the determined peaks of the amplified signal; and, f.) repeating steps d.) and e.). The invention also includes an apparatus for implementing the method of the invention.


Find Patent Forward Citations

Loading…