The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2005

Filed:

Oct. 02, 2001
Applicants:

James R. Magro, Austin, TX (US);

Bruce A. Loyer, Austin, TX (US);

Pratik M. Mehta, Austin, TX (US);

Inventors:

James R. Magro, Austin, TX (US);

Bruce A. Loyer, Austin, TX (US);

Pratik M. Mehta, Austin, TX (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F001/06 ;
U.S. Cl.
CPC ...
Abstract

A system for coordinating the timing of a data strobe with data supplied by a memory module to the memory controller read data FIFO of a processor-based system, providing multiple calibration modes. A calibration PDL (programmable delay line) is used to reiteratively test the time taken for a test data strobe to traverse a portion of the memory controller circuit, and to generate a calibration value based upon the time taken. The calibration procedure may be initiated in any one of several modes, including: according to a predetermined schedule; implemented in software; in response to changes in environmental factors such as temperature or voltages sampled at one or more locations; in response to a software-driven trigger; or in response to a user-initiated trigger, communicated to a system of the invention either by input via a user interface to the processor-based system or by a software command.


Find Patent Forward Citations

Loading…