The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2005
Filed:
Jul. 22, 2002
Steve Klotz, Austin, TX (US);
Michael D. Connell, Pflugerville, TX (US);
Mark J. Lanteigne, Austin, TX (US);
Steve Klotz, Austin, TX (US);
Michael D. Connell, Pflugerville, TX (US);
Mark J. Lanteigne, Austin, TX (US);
Finisar Corporation, Sunnyvale, CA (US);
Abstract
Embodiments of the present invention generally provide a system and method for testing integrity of data transmitted to and from a target device through a data connection. In one embodiment, the method generally includes creating one or more test threads. The method further includes, for each test thread, generating a data load on the data connection by repetitively writing test data patterns to the target device and reading data patterns from the target device using a synchronous I/O dispatch method, measuring data throughput to and from the target device while generating the data load, comparing the data patterns read from the target device to the test data patterns to detect data corruptions. The method may further include generating debug information if a data corruption is detected by one of the test threads.