The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2005
Filed:
Dec. 13, 2002
Narayana Sateesh Pillai, Plano, TX (US);
Narayana Sateesh Pillai, Plano, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
An automatic tester for an analog micromirror device includes a computer having an ADC and DAC connected to its peripheral bus. A micromirror device under test is mounted on a black box containing a light source such as a laser and a position sensitive device. The light beam is reflected by the micromirror device onto the position sensitive device so that the deflection of the mirror in two axes can be measured. The output of the position sensitive device is amplified and coupled to the ADC via a tester board. The computer can test the micromirror device to detect mechanical failure and to measure the resonant frequency and Q of the driving coils, and SNR of the internal package feedback which measures the position of the mirror.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile