The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2005
Filed:
Jan. 29, 2002
Joachim Neuhaus, Steinen, DE;
Wolfgang Kämereit, Maulburg, DE;
Joachim Neuhaus, Steinen, DE;
Wolfgang Kämereit, Maulburg, DE;
Endress + Hauser GmbH + Co. KG, Maulburg, DE;
Abstract
The invention relates to a method for determining and presenting an optimized arrangement and assembly of a measurement system of process measurement technology, especially of a radiometric measurement system, at a container or pipe, in which measurement system at least one characterizing parameter of a medium contained in the container or pipe is to be measured. The method proceeds with the aid of at least a first electronic computer () and a second electronic computer () connected therewith and containing a display- (), a processor-controlled, data processing- () and an input-device (), wherein container- or pipe-specific data and information on medium and on expected measurement range are taken into consideration. The method establishes therefrom an optimized arrangement of the measurement system at or on the container or pipe and presents this arrangement in a sketch. The invention produces at greatest possible speeds the optimized design of the measurement system, also respecting safety aspects, and this in direct contact between a customer and a manufacturer of such a measurement system, or a project planer.