The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2005
Filed:
Aug. 23, 1999
Mark O. Worthington, Tustin, CA (US);
Gregory R. Basile, Farmers Branch, TX (US);
Mark O. Worthington, Tustin, CA (US);
Gregory R. Basile, Farmers Branch, TX (US);
Nagaoka & Co., Ltd., Hyogo, JP;
Burstein Technologies, Inc., Irvine, CA (US);
Abstract
Methods and apparatus for analyzing nonoperational data acquired from optical discs, and in particular, trackable optical discs having concurrently readable nonoperational structures are provided. Analysis can involve identifying patterns in the data that reproducibly distinguish underlying structures, or identifying patterns in the data that report physical properties of the nonoperational structures. When an optical disc has a plurality of physically nonidentical concurrently readable nonoperational structures, analysis can involve identifying patterns in the data that distinguish among the physically nonidentical nonoperational structures. Also, relative physical locations of nonoperational structures on the disc can be calculated. A system for remotely analyzing data in order to expedite complex data analysis and reporting the results thereof is also provided.