The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2005
Filed:
Feb. 08, 2002
Stéphane Caplette, Longueuil, CA;
Sylvain Cloutier, Providence, RI (US);
Charles Massicotte, Montreal, CA;
Alain Villeneuve, Montreal, CA;
Stéphane Caplette, Longueuil, CA;
Sylvain Cloutier, Providence, RI (US);
Charles Massicotte, Montreal, CA;
Alain Villeneuve, Montreal, CA;
ITF Technologies Optiques Inc., Montreal, CA;
ITF Optical Technologies Inc., Montreal, CA;
Abstract
This invention provides a method of obtaining accurate measurements of polarization dependent loss and insertion loss during the tests aiming at measuring the polarization properties of optical components. This is achieved by taking into account every polarization disturbance in the line between generation of known states of polarization and the device under test. The method involves computing within a desired range of wavelengths either the transfer matrix of each polarization perturbing element or of all polarization perturbing elements as a whole, and compensating for errors introduced by these polarization perturbing elements.