The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2005

Filed:

Dec. 14, 2000
Applicants:

Kieran Gerard Larkin, Putney, AU;

Dominic Yip, Lindfield, AU;

Ian Richard Gibson, Coogee, AU;

Inventors:

Kieran Gerard Larkin, Putney, AU;

Dominic Yip, Lindfield, AU;

Ian Richard Gibson, Coogee, AU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N005/228 ;
U.S. Cl.
CPC ...
Abstract

A method and apparatus () for estimating the blur parameters of blurred images (g, g) are disclosed. The apparatus () has one or more image sensors () for capturing the blurred images (g, g), a plurality of correlators () for performing autocorrelation of the blurred image (g) and cross-correlation between the two images (g, g) respectively, and an error function calculator () for evaluating an error function over all possible displacements using the results from the correlators (). The apparatus () further includes an extreme locater () for finding the displacement with the minimum value for the error function.


Find Patent Forward Citations

Larkin, Kieran. (2005). Method and apparatus for uniform lineal motion blur estimation using multiple exposures (U.S. Patent No. 6888566). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6888566

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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