The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2005

Filed:

May. 24, 2002
Applicants:

Jorge E Caviedes, Yorktown Heights, NY (US);

Sabri Gurbuz, Central, SC (US);

Inventors:

Jorge E Caviedes, Yorktown Heights, NY (US);

Sabri Gurbuz, Central, SC (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N017/00 ; H04N005/213 ;
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method and system for evaluating the quality of video data without gaining access to the source data. The system is configured to estimate sharpness metrics by detecting edge pixels and enclosing them with 8×8 pixel blocks. For each block, the sharpness according to the Kurtosis of the DCT is computed. The final metric is the average sharpness of the blocks in the edge profile and includes a robust combination of spatial and frequency domain information.


Find Patent Forward Citations

Caviedes, Jorge. (2005). Method and system for estimating sharpness metrics based on local edge kurtosis (U.S. Patent No. 6888564). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6888564

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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