The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2005
Filed:
Sep. 23, 2002
Akihiko Yamano, Kanagawa, JP;
Mitsutoshi Kuno, Kanagawa, JP;
Shuji Aoki, Kanagawa, JP;
Takahiro Oguchi, Kanagawa, JP;
Akihiko Yamano, Kanagawa, JP;
Mitsutoshi Kuno, Kanagawa, JP;
Shuji Aoki, Kanagawa, JP;
Takahiro Oguchi, Kanagawa, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
There is provided a characteristic adjustment method for an image forming apparatus that is provided with a multi-electron source in which a plurality of electron-emitting devices are electrically connected by wiring and arranged on a substrate and a fluorescent member for emitting light by irradiation of an electron beam, the method including: a measurement step of dividing a display portion of the image forming apparatus into a plurality of areas and measuring light emitting characteristics of at least one or more of the electron-emitting devices in the respective divided areas, and a shifting step of shifting the light emitting characteristics of the electron-emitting devices in the divided areas to individual characteristic target values by applying a characteristic shift voltage to the electron-emitting devices.