The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2005
Filed:
Jun. 10, 2003
Applicants:
Hong-beom Kim, Suwon, KR;
Ho-jin Park, Yongin, KR;
Sung-hwan IN, Seoul, KR;
Ha-il Kim, Seoul, KR;
Inventors:
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R031/26 ;
U.S. Cl.
CPC ...
Abstract
A semiconductor chip test system and test method thereof are provided. The system having a plurality of data input/output pins, a tester for inputting/outputting data through the plurality of data input/output pins; a plurality of semiconductor chips to be tested by the tester; a control circuit for sequentially outputting the output data from each of the plurality of semiconductor chips to the tester during a read operation and simultaneously supplying the input data from the tester to the semiconductor chips during a write operation.