The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2005

Filed:

Apr. 22, 2003
Applicants:

Frank Bläsing, Werl, DE;

Christian Schirp, Bochum, DE;

Inventors:

Frank Bläsing, Werl, DE;

Christian Schirp, Bochum, DE;

Assignee:

Leopold Kostal GmbH & Co. KG, Ludenscheid, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R031/04 ; G01R031/26 ;
U.S. Cl.
CPC ...
Abstract

An electric circuit arrangement and method for checking intactness of both a photodiode array and an electrical connection between an array output and a microprocessor input. The array output has a high resistance when the array is inactive and intact. In case of array error, the array output is connected via in each case a defined internal resistance to ground and supply voltages. The circuit arrangement enables at any time an assessment of the status of the connection and, if the connection is intact, enables an assessment of array intactness. This is achieved by connecting the array output via a first test resistor arranged in the spatial vicinity of the array to the ground voltage and by connecting the microprocessor input via a second test resistor arranged in the spatial vicinity of the microprocessor to a microprocessor port output which can be connected either to the ground or supply voltages.


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