The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2005
Filed:
Feb. 20, 2002
Applicant:
Tomitaka Yamashita, Shuuchi-gun, JP;
Inventor:
Tomitaka Yamashita, Shuuchi-gun, JP;
Assignee:
Kabushiki Kaisha Moric, Mori-machi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R031/00 ;
U.S. Cl.
CPC ...
Abstract
An inspection process and method that is performed not by the operation of a PC but within the inspection device itself according to the inspection program stored in a memory circuit in the inspection device. Therefore, the inspection is performed without being affected by the performance of a PC with constant stability and reliability.
Quick Actions:
Yamashita, Tomitaka. (2005). Signal inspection device (U.S. Patent No. 6885962). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6885962
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